Second Test Coil for the Development of a Compact 3 T MgB2 Magnet

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Bibliographic Details
Published inIEEE transactions on applied superconductivity Vol. 23; no. 3
Main Authors MINE, Susumu, MINFENG XU, BURESH, Steve, STAUTNER, Wolfgang, IMMER, Christopher, LASKARIS, Evangelos T, AMM, Kathleen, GRASSO, Gianni
Format Conference Proceeding
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 01.06.2013
Subjects
Applied sciences
Design. Technologies. Operation analysis. Testing
Electrical engineering. Electrical power engineering
Electromagnets
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Various equipment and components
Cooling
Thermal management (packaging)
Magnet
cryo-cooler
Conduction cooling
MgB
Compact design
Non uniform distribution
Degradation
Superconducting magnet
Particle size distribution
Cooler
Critical current
Mechanical stress
Manufacturing process
n-value
Cooling system
Critical temperature
Magnetic field
Voltage distribution
Damaging
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ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2012.2232692