Structure-properties relationships in electrodeposited Ni-W thin films with columnar nanocrystallites
Ni-W thin films with columnar nanocrystallites have been prepared by electrodeposition. Samples containing from zero to 18 wt.% W and 140 nm in thickness have been selected for measurements. Perpendicular magnetic anisotropy (PMA) was clearly observed in films with tungsten content of about 13 wt.%....
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| Published in | Journal of Optoelectronics and Advanced Materials Vol. 5; no. 2; pp. 421 - 427 |
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| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
01.06.2003
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| Online Access | Get full text |
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| Summary: | Ni-W thin films with columnar nanocrystallites have been prepared by electrodeposition. Samples containing from zero to 18 wt.% W and 140 nm in thickness have been selected for measurements. Perpendicular magnetic anisotropy (PMA) was clearly observed in films with tungsten content of about 13 wt.%. Typical films of this composition consisted of columnar nanocrystallites of about 12.5 nm size in diameter embedded in an amorphous Ni-W matrix. This segregated mixed structure, i.e., two-phase heterogeneous alloy film, resulted in the large PMA energy constant K#p of 120 kJ/m3 and in the high perpendicular coercivity Hc#p of 120 kA/m. Also, these two-phase Ni-W thin films exhibited sufficiently high saturation magnetization Ms of 420 kA/m. It is concluded that electrodeposited Ni-W typical thin film (13 wt.% W) may be applicable for the media in the perpendicular magnetic recording system. |
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| Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| ISSN: | 1454-4164 |