Electrical characteristics of magnetic memory cells comprising magnetic tunnel junctions and GaAs diodes
Magnetic tunnel junctions have been the subject of study for use in nonvolatile magnetic memories. To cancel leakage paths in the memory array, a semiconductor switch is integrated per cell. Successful integration with GaAs diodes, dominating the cell performance, is described. Good resistance match...
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Published in | Electronics letters Vol. 36; no. 21; pp. 1782 - 1783 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
12.10.2000
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Online Access | Get full text |
ISSN | 0013-5194 |
DOI | 10.1049/el:20001242 |
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Summary: | Magnetic tunnel junctions have been the subject of study for use in nonvolatile magnetic memories. To cancel leakage paths in the memory array, a semiconductor switch is integrated per cell. Successful integration with GaAs diodes, dominating the cell performance, is described. Good resistance matching between both elements is essential to optimize the output characteristics, i.e. the absolute voltage or current difference between the two magnetic states. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0013-5194 |
DOI: | 10.1049/el:20001242 |