X-ray diffraction measurement below 1 K

Saved in:
Bibliographic Details
Published inJournal of low temperature physics Vol. 128; no. 1-2; pp. 1 - 7
Main Authors SUZUKI, H, NAHER, S, SHIMOGUCHI, T, MIZUNO, M, RYU, A, FUJISHITA, H
Format Journal Article
LanguageEnglish
Published Heidelberg Springer 01.07.2002
Subjects
Condensed matter: structure, mechanical and thermal properties
Crystalline state (including molecular motions in solids)
Crystallographic aspects of phase transformations; pressure effects
Exact sciences and technology
Physics
Single-crystal and powder diffraction
Structure of solids and liquids; crystallography
X-ray diffraction and scattering
Inorganic compounds
Lattice distortion
Tetragonal lattices
Phase transformations
Ternary compounds
Transition element compounds
Experimental device
XRD
Experimental study
Jahn-Teller effect
Orthorhombic lattices
Thulium Vanadates
Low temperature
Online AccessGet full text

Cover

More Information
ISSN:0022-2291
1573-7357
DOI:10.1023/A:1015729021796