Morphology changes of thin Pd films grown on SiO2 : influence of adsorbates and temperature

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Bibliographic Details
Published inThin solid films Vol. 342; no. 1-2; pp. 297 - 306
Main Authors ERIKSSON, M, OLSSON, L, HELMERSSON, U, ERLANDSSON, R, EKEDAHL, L.-G
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier Science 26.03.1999
Subjects
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Metals. Metallurgy
Physics
Structure and morphology; thickness
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Temperature dependence
Atomic force microscopy
Morphological changes
Adsorbates
Surfaces
Controlled atmospheres
Restructuration
Agglomeration
Palladium
Experimental study
Photoelectron spectroscopy
Thin films
Exhibits
Ultraviolet radiation
Transition elements
Capacitance
Kinetics
Thermal annealing
Ultrahigh vacuum
TEM
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ISSN:0040-6090
DOI:10.1016/S0040-6090(98)01395-9