X-ray-diffraction mapping of epitaxial YBa2Cu3O7-x thin films: Determination of in-plane epitaxy and a-, b-, and c-axis lengths in films with varying oxygen deficiency

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Bibliographic Details
Published inPhysical review. B, Condensed matter Vol. 47; no. 6; p. 3431
Main Authors Han, Z, Helmersson, U, Selinder, TI, Sundgren, J
Format Journal Article
LanguageEnglish
Published United States 01.02.1993
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ISSN:0163-1829
DOI:10.1103/PhysRevB.47.3431