Dissipative tunneling in two-state systems at the Si/SiO2 interface

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Bibliographic Details
Published inPhysical review letters Vol. 71; no. 25; p. 4230
Main Authors Cobden, DH, Uren, MJ, Pepper, M
Format Journal Article
LanguageEnglish
Published United States 20.12.1993
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ISSN:1079-7114
DOI:10.1103/PhysRevLett.71.4230