Measurement of C2 and CH temperatures in argon‐acetylene low‐pressure microwave‐induced plasma

The emission spectra of C2(d3Πg–a3Πu), CH(A2Δ–X2Π), and CH(B2Σ–X2Π) bands are analysed to measure rotational Trot, vibrational Tvib, and gas temperature Tg from Ar/C2H2 (5–20% C2H2) microwave‐induced plasma (MIP). In case when helium and hydrogen are used in the gas mixture instead of argon, no sign...

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Bibliographic Details
Published inContributions to plasma physics (1988) Vol. 59; no. 7
Main Authors Jovović, J., Majstorović, G.Lj
Format Journal Article
LanguageEnglish
Published Weinheim WILEY‐VCH Verlag GmbH & Co. KGaA 01.08.2019
Wiley Subscription Services, Inc
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Summary:The emission spectra of C2(d3Πg–a3Πu), CH(A2Δ–X2Π), and CH(B2Σ–X2Π) bands are analysed to measure rotational Trot, vibrational Tvib, and gas temperature Tg from Ar/C2H2 (5–20% C2H2) microwave‐induced plasma (MIP). In case when helium and hydrogen are used in the gas mixture instead of argon, no significant change in Trot is noticed. Both studied temperatures are insensitive in terms of the C2H2 percentage. From CH(0–0, A2Δ–X2Π) band R2 branch lines, two Trot (Trot ∼ 520–580 K for J′ = 3–9 and Trot ∼ 1,700–1,800 K for J′ = 10–17) are determined. The lower Trot equals the Tg (500–700 K) measured from C2 bands in this study. The H2 Fulcher‐α diagonal bands are recorded as well in the H2/C2H2 mixtures and Trot∼750–900 K of the H2 ground state measured. Tvib ∼ 6,000 K in Ar/C2H2 MIP is calculated from the integral intensity ratio of C2(2,1) and C2(3,2) bands. A spectroscopic diagnostics of acetylene‐containing microwave‐induced plasma source is presented. A set of well‐resolved C2 and CH emission bands is analysed to measure Trot, Tvib, and Tg in Ar/C2H2, He/C2H2, and H2/C2H2 gas mixtures. The knowledge of Tg in this type of plasma source is of particular interest in the field of deposition of carbon‐containing and hydrocarbon‐containing layers.
ISSN:0863-1042
1521-3986
DOI:10.1002/ctpp.201800147