The variation of the enhanced photoluminescence efficiency of Y2O3:Eu3+ films with the thickness to the photonic crystal layer

• Published in: Optics express Vol. 16; no. 8; pp. 5689 - 5696
• Main Authors: Ko, Ki-Young, Lee, Young Kwang, Park, Hoo Keun, Kim, Yoon-Chang, Do, Young Rag
• Format: Journal Article
• Language: English
• Published: United States 14.04.2008
• Subjects: Computer Simulation; Computer-Aided Design; Crystallization - methods; Equipment Design; Equipment Failure Analysis; Europium - chemistry; Lighting - instrumentation; Lighting - methods; Luminescent Measurements - instrumentation; Luminescent Measurements - methods; Membranes, Artificial; Models, Theoretical; Photons; Yttrium - chemistry
• ISSN: 1094-4087
• DOI: 10.1364/OE.16.005689

This study examined the effects of the thickness of Y(2)O(3):Eu(3+) phosphor films on quartz substrates coated with two-dimensional (2D) SiO(2) square-lattice nanorod photonic crystal layers (PCL) at identical heights on their extraction and absorption efficiency. The photoluminescence (PL) efficiency enhancement ratio decreased exponentially with increasing Y(2)O(3):Eu(3+) film thickness. The 2D PCL-assisted Y(2)O(3):Eu(3+) film with a thickness (t) = 400 nm showed enhancement in the upward and downward PL emission by factors of 6.2 and 8.6, respectively, with respect to those of a conventional flat film. This observation was attributed to diffraction scattering of the excitation and emission light.