A 10 b 120 Msample/s time-interleaved analog-to-digital converter with digital background calibration
A 10 b 120 Msample/s time-interleaved analog-to -digital converter (ADC) was studied. This time-interleaved pipelined ADC uses digital background calibration to overcome the effects of mismatch errors without affecting the signal spectrum, without a calibration signal, and without a front-rank sampl...
Saved in:
Published in | Digest of technical papers - IEEE International Solid-State Circuits Conference pp. 132 - 133+436 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
01.01.2002
|
Online Access | Get full text |
Cover
Loading…
Summary: | A 10 b 120 Msample/s time-interleaved analog-to -digital converter (ADC) was studied. This time-interleaved pipelined ADC uses digital background calibration to overcome the effects of mismatch errors without affecting the signal spectrum, without a calibration signal, and without a front-rank sample-and-hold amplifier (SHA). Time interleaving can increase the speed of an ADC, but mismatch erros usually limit the overall accuracy. |
---|---|
Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 |
ISSN: | 0193-6530 |