Thickness Analysis of epsilon and gamma-iron Nitride Using X-ray Diffraction
Thicknesses of s and y'-iron nitride in bilayer(s/y) compound were estimated using x-ray diffraction. The validity of formulation model was checked by comparing calculations with metallographic analysis of iron nitride compound layer grown on steels with gas nitriding. The thicknesses of c and...
Saved in:
| Published in | Journal of the Korean Institute of Metals and Materials Vol. 45; no. 11; pp. 609 - 614 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | Korean |
| Published |
01.11.2007
|
| Online Access | Get full text |
Cover
Loading…
| Summary: | Thicknesses of s and y'-iron nitride in bilayer(s/y) compound were estimated using x-ray diffraction. The validity of formulation model was checked by comparing calculations with metallographic analysis of iron nitride compound layer grown on steels with gas nitriding. The thicknesses of c and y'-iron nitride formed on SPHC steel estimated by the model using E(111) and y(200) diffraction intensity were 2 lam and 1.7 mm respectively. These are well matched with the results measured by microscope. The calculated thicknesses of the compound layers grown on low alloy steels well agree to the results measured by microscope. However, the estimated results for high alloy steels are thicker than metallographic analysis. |
|---|---|
| Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| ISSN: | 1738-8228 |