Measurement of linear-response Coulomb drag in insulating a-Si1-xNbx bilayer systems

• Published in: Solid state communications Vol. 148; no. 7-8; pp. 261 - 266
• Main Authors: ELSAYAD, K, CARINI, J. P, BAXTER, D. V
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier 01.11.2008
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Conductivity of specific materials; Disordered solids; Electronic transport in condensed matter; Exact sciences and technology; Physics; A. Anderson insulators; 73.20.Fz; Niobium alloys; Amorphous alloy; 73.21.Ac; Electronic density of states; Coulomb interaction; Hopping conduction; A. Silicon-Niobium; Thickness; Silicon alloys; Temperature effects; Anderson insulating; 73.61.Jc; D. Coulomb drag; Transport processes; D. Variable range hopping
• ISSN: 0038-1098; 1879-2766
• DOI: 10.1016/j.ssc.2008.09.019