Reduction of ru underlayer thickness for CoCrPt-SiO2 perpendicular recording media

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Bibliographic Details
Published inIEEE transactions on magnetics Vol. 42; no. 10; pp. 2381 - 2383
Main Authors SHEN, W. K, DAS, Anirban, RACINE, Michael, CHENG, Randy, JUDY, Jack, WANG, J. P
Format Conference Proceeding
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 01.10.2006
Subjects
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Other topics in materials science
Physics
Interfacial layer
residual gas
Ta seedlayer
Roughness
Silica
Surface states
surface roughness
perpendicular magnetic recording media
Thickness
CocrPt-SiO2 perpendicular media
Proceedings
intermediate layer
X-ray reflectivity
Recording material
exchange de-coupling
Ru underlayer
Magnetic recording
Magnetic properties
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More Information
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2006.878685