Zr:CeO2 Buffer by CSD on Ni-W Substrate for Low-Cost Fe(Se,Te) Coated Conductor

Although Fe(Se,Te) film shows limited superconducting properties compared to REBCO in terms of critical temperature and critical current density, it represents a potential low-cost alternative to REBCO-based coated conductor applications at low temperature and high field condition. In fact, due to t...

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Bibliographic Details
Published inIEEE transactions on applied superconductivity Vol. 34; no. 3; p. 1
Main Authors Vannozzi, Angelo, Piperno, Laura, Rufoloni, Alessandro, Botti, Sabina, Bonfigli, Francesca, Iebole, Michela, Savio, Letizia, Cialone, Matteo, Masi, Andrea, Mancini, Antonella, Augieri, Andrea, Celentano, Giuseppe, Braccini, Valeria, Putti, Marina
Format Journal Article
LanguageEnglish
Published New York The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 01.05.2024
Subjects
Buffer layers
Cerium oxides
Conductors
Critical current density
Critical temperature
Diffusion layers
Electron back scatter
Electrons
Epitaxial growth
Film growth
Iron
Low cost
Low temperature
Photoelectrons
Pulsed laser deposition
Pulsed lasers
Selenium
Substrates
Superconductivity
Tellurium
X ray photoelectron spectroscopy
Zirconium
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Summary:Although Fe(Se,Te) film shows limited superconducting properties compared to REBCO in terms of critical temperature and critical current density, it represents a potential low-cost alternative to REBCO-based coated conductor applications at low temperature and high field condition. In fact, due to the low deposition temperature and absence of oxygen, materials constraints are less strict and Fe(Se,Te) coated conductor can be realized using a very simplified architecture. A further process simplification is the use of cube-textured substrate combined with a single buffer layer by chemical solution deposition (CSD), which may provide a cheap, vacuum-free route for oriented template fabrication. Zr-doped CeO2/Ni-W templates were realized by CSD and successfully tested with epitaxial Fe(Se,Te) film growth by pulsed laser deposition showing good superconducting properties. Further, a detailed analysis before and after buffer layer deposition using optical, atomic, and scanning electron microscopy, electron backscattered diffraction and Raman and X-ray photoelectron spectroscopy was carried out to relate Zr-doped CeO2 film quality to Ni-W microstructure, morphology, and composition. Results show that 30-nm-thick Zr-doped CeO2 film is effective to prevent Ni diffusion. Further, buffer-layer quality is mainly dependent on the characteristics of individual Ni-W grains.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2024.3354220