Spontaneous delamination via compressive buckling facilitates large-scale [beta]-Ga2O3 thin film transfer from reusable GaAs substrates

The fabrication and transfer via spontaneous delamination of large-area, high-quality [beta]-Ga2O3 nanoscale thin films with centimeter-scale dimensions is demonstrated via thermal oxidation of reusable GaAs substrates. The films are characterized by using X-ray diffraction, energy dispersive spectr...

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Bibliographic Details
Published inPhysica status solidi. A, Applications and materials science Vol. 214; no. 10
Main Authors Kaya, Ahmet, Dryden, Daniel M, Woodall, Jerry M, Islam, M Saif
Format Journal Article
LanguageEnglish
Published Weinheim Wiley Subscription Services, Inc 01.10.2017
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Summary:The fabrication and transfer via spontaneous delamination of large-area, high-quality [beta]-Ga2O3 nanoscale thin films with centimeter-scale dimensions is demonstrated via thermal oxidation of reusable GaAs substrates. The films are characterized by using X-ray diffraction, energy dispersive spectroscopy, Raman spectroscopy, and scanning electron microscopy. The film demonstrates good mechanical flexibility facilitating reliable transfer. The [beta]-Ga2O3 film's optical band gap and Schottky barrier height with gold are 4.8 and 1.03eV, respectively. Electrical and optical properties of the transferable [beta]-Ga2O3 thin films exhibit a potential for application in solar-blind photodetectors. The scale of the [beta]-Ga2O3 films transferred herein exceeds what the research community has reported to-date by more than four orders of magnitude. The macroscopic dimensions of the transferred films may offer a remedy for the low thermal conductance of [beta]-Ga2O3 via transfer onto substrates with high thermal conductivity.
ISSN:1862-6300
1862-6319
DOI:10.1002/pssa.201700102