Probability of Electron Capture by {sup 3}He{sup 2+} Ions from Argon Atoms at Different Impact Parameters

We have measured the absolute values of total cross sections of capture of one and two electrons by He{sup 2+} ions from argon atoms. The differential scattering cross sections have been determined for fast atoms and singly charged helium ions formed in each of these processes (without and with addi...

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Bibliographic Details
Published inTechnical physics Vol. 64; no. 3
Main Authors Basalaev, A. A., Panov, M. N.
Format Journal Article
LanguageEnglish
Published United States 15.03.2019
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Summary:We have measured the absolute values of total cross sections of capture of one and two electrons by He{sup 2+} ions from argon atoms. The differential scattering cross sections have been determined for fast atoms and singly charged helium ions formed in each of these processes (without and with additional ionization of the formed slow argon ion). Measurements have been taken for He{sup 2+} ions with kinetic energy of 6 keV in scattering angle range 0–2.5°. Based on the measured differential cross sections using different model atomic particle interaction potentials, we have calculated the cross sections of these processes as functions of the impact parameter. The probabilities of realization of these processes with electron density distribution in different shells in the target atom have been compared. The applicability of the expressions for the screened Coulomb interaction potentials in the description of scattering of particles that have captured electrons has been demonstrated.
ISSN:1063-7842
1090-6525
DOI:10.1134/S1063784219030058