Zone‐doubled Fresnel zone plates for high‐resolution hard X‐ray full‐field transmission microscopy

Full‐field transmission X‐ray microscopy is a unique non‐destructive technique for three‐dimensional imaging of specimens at the nanometer scale. Here, the use of zone‐doubled Fresnel zone plates to achieve a spatial resolution better than 20 nm in the hard X‐ray regime (8–10 keV) is reported. By ob...

Full description

Saved in:
Bibliographic Details
Published inJournal of synchrotron radiation Vol. 19; no. 5; pp. 705 - 709
Main Authors Vila‐Comamala, Joan, Pan, Yongsheng, Lombardo, Jeffrey J., Harris, William M., Chiu, Wilson K. S., David, Christian, Wang, Yuxin
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.09.2012
Subjects
Fresnel zone plate
Fresnel zones
full‐field transmission X‐ray microscopy
hard X‐rays
Imaging
Nondestructive testing
Plates
Research Papers
solid‐oxide fuel cell
Synchrotron radiation
Three dimensional
X-rays
Yttria stabilized zirconia
Online AccessGet full text

Cover

More Information
Summary:Full‐field transmission X‐ray microscopy is a unique non‐destructive technique for three‐dimensional imaging of specimens at the nanometer scale. Here, the use of zone‐doubled Fresnel zone plates to achieve a spatial resolution better than 20 nm in the hard X‐ray regime (8–10 keV) is reported. By obtaining a tomographic reconstruction of a Ni/YSZ solid‐oxide fuel cell, the feasibility of performing three‐dimensional imaging of scientifically relevant samples using such high‐spatial‐resolution Fresnel zone plates is demonstrated.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ObjectType-Article-2
ObjectType-Feature-1
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049512029640