The application of wavelet shrinkage denoising to magnetic Barkhausen noise measurements

The application of Magnetic Barkhausen Noise (MBN) as a non-destructive method of defect detection has proliferated throughout the manufacturing community. Instrument technology and measurement methodology have matured commensurately as applications have moved from the R&D labs to the fully auto...

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Bibliographic Details
Published inAIP conference proceedings Vol. 1581; no. 1
Main Author Thomas, James
Format Conference Proceeding Journal Article
LanguageEnglish
Published Melville American Institute of Physics 18.02.2014
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Summary:The application of Magnetic Barkhausen Noise (MBN) as a non-destructive method of defect detection has proliferated throughout the manufacturing community. Instrument technology and measurement methodology have matured commensurately as applications have moved from the R&D labs to the fully automated manufacturing environment. These new applications present a new set of challenges including a bevy of error sources. A significant obstacle in many industrial applications is a decrease in signal to noise ratio due to (i) environmental EMI and (II) compromises in sensor design for the purposes of automation. The stochastic nature of MBN presents a challenge to any method of noise reduction. An application of wavelet shrinkage denoising is proposed as a method of decreasing extraneous noise in MBN measurements. The method is tested and yields marked improvement on measurements subject to EMI, grounding noise, and even measurements in ideal conditions.
Bibliography:ObjectType-Conference Proceeding-1
SourceType-Conference Papers & Proceedings-1
content type line 21
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4864969