The application of wavelet shrinkage denoising to magnetic Barkhausen noise measurements
The application of Magnetic Barkhausen Noise (MBN) as a non-destructive method of defect detection has proliferated throughout the manufacturing community. Instrument technology and measurement methodology have matured commensurately as applications have moved from the R&D labs to the fully auto...
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Published in | AIP conference proceedings Vol. 1581; no. 1 |
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Main Author | |
Format | Conference Proceeding Journal Article |
Language | English |
Published |
Melville
American Institute of Physics
18.02.2014
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Subjects | |
Online Access | Get full text |
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Summary: | The application of Magnetic Barkhausen Noise (MBN) as a non-destructive method of defect detection has proliferated throughout the manufacturing community. Instrument technology and measurement methodology have matured commensurately as applications have moved from the R&D labs to the fully automated manufacturing environment. These new applications present a new set of challenges including a bevy of error sources. A significant obstacle in many industrial applications is a decrease in signal to noise ratio due to (i) environmental EMI and (II) compromises in sensor design for the purposes of automation. The stochastic nature of MBN presents a challenge to any method of noise reduction. An application of wavelet shrinkage denoising is proposed as a method of decreasing extraneous noise in MBN measurements. The method is tested and yields marked improvement on measurements subject to EMI, grounding noise, and even measurements in ideal conditions. |
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Bibliography: | ObjectType-Conference Proceeding-1 SourceType-Conference Papers & Proceedings-1 content type line 21 |
ISSN: | 0094-243X 1551-7616 |
DOI: | 10.1063/1.4864969 |