A study on masking system using 1/f fluctuation to improve comfort in ultra-compact EVs

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Bibliographic Details
Published inInternational Journal of Applied Electromagnetics and Mechanics Vol. 71; pp. S373 - S382
Main Authors Takuya Kitamura, Fumiya Maehara, Taro Kato, Daigo Uchino, Kazuki Ogawa, Keigo Ikeda, Ayato Endo, Takayoshi Narita, Hideaki Kato
Format Journal Article
LanguageEnglish
Japanese
Published SAGE Publications 14.04.2023
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ISSN:1383-5416
1875-8800
DOI:10.3233/jae-220180