Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy

We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the twod...

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Bibliographic Details
Published inApplied optics (2004) Vol. 31; no. 8; p. 1083
Main Authors Hazra, R, Viles, C L, Park, S K, Reichenbach, S E, Sieracki, M E
Format Journal Article
LanguageEnglish
Published United States 10.03.1992
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Summary:We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the twodimensional frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample-scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.
ISSN:1559-128X
DOI:10.1364/AO.31.001083