기준패턴과 증착패턴의 동시 측정을 통한 OLED 공정 검사 방법

• Published in: (사)디지털산업정보학회 논문지, 15(4) Vol. 15; no. 4; pp. 63 - 70
• Main Authors: 곽병호, 최경주, Kwak, Byeongho, Cheoi, Kyungjoo
• Format: Journal Article
• Language: Korean
• Published: (사)디지털산업정보학회 01.12.2019
• Subjects: 컴퓨터학; Deposition Pattern; Standard Pattern; OLED inspection
• ISSN: 1738-6667; 2713-9018

The subject of the simultaneous measuring system of base pattern and deposition pattern is a new research topic on a defect inspection of OLED. In this paper, we propose a new OLED inspection method that simultaneously measures standard and deposition pattern images. This method reduces unnecessary processes and tac time during OLED inspection. For an additional reduction of the tac time during pattern measurement, the ROI was configured to measure only in the designated ROI area instead of measuring the entire area of an image. During the ROI set-up, the value of effective deposition pattern area is included so that if the deposition pattern is out of the ROI zone, it would be treated as a defect before measuring the size and center point of the pattern. As a result, the tac time and inspection process could be shortened. The proposed method also could be applied to the OLED manufacturing process. Production of OLED could be increased by reducing tac time and inspection process.