Failure Analysis Tools
Regardless of whether a module has degraded from field exposure or accelerated stress testing, it is important to understand what has actually changed within the module that led to lost peak power. This chapter explores some of the methods used to better understand what has gone wrong within the mod...
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Published in | Photovoltaic Module Reliability p. 1 |
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Main Author | |
Format | Book Chapter |
Language | English |
Published |
United Kingdom
John Wiley & Sons
2020
John Wiley & Sons, Incorporated John Wiley & Sons, Ltd |
Subjects | |
Online Access | Get full text |
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Summary: | Regardless of whether a module has degraded from field exposure or accelerated stress testing, it is important to understand what has actually changed within the module that led to lost peak power. This chapter explores some of the methods used to better understand what has gone wrong within the module. Methods reviewed include, analysis of the I‐V parameters, measurement of performance at different irradiances, visual inspection, infrared inspection, electroluminescence and evaluation of adhesion. By analyzing the data from the light I–V curve we can often get a better idea of what has degraded. Another way to see the impacts of series and shunt resistance is to plot the dark I–V curve of the module. Some of the failure modes that occur in modules have no (or minimal) impact on how the modules appear. For visual inspection to be a useful tool, it should be guided by experience. |
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ISBN: | 1119458994 9781119458999 |
DOI: | 10.1002/9781119459019.ch5 |