Strain-Induced Dewetting of Germanium Layers on Silicon
Ge and SiGe layers deposited on Si are unstable due to their lattice strain. At high temperatures they undergo dewetting, leading to their segregation into the structures with different surface morphologies. The process depends on the crystallographic Si substrate orientation, chemical composition,...
Saved in:
Published in | PHYSICS, CHEMISTRY AND APPLICATIONS OF NANOSTRUCTURES p. 1 |
---|---|
Main Author | |
Format | Book Chapter |
Language | English |
Published |
World Scientific
2015
WORLD SCIENTIFIC |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Ge and SiGe layers deposited on Si are unstable due to their lattice strain. At high temperatures they undergo dewetting, leading to their segregation into the structures with different surface morphologies. The process depends on the crystallographic Si substrate orientation, chemical composition, and thickness of deposited layers. We study the surface morphologies using scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). |
---|---|
ISBN: | 9789814696517 981469651X 9789814696524 9814696528 9789814696531 9814696536 |
DOI: | 10.1142/9789814696524_0100 |