Measurements of thermoelectric properties of identical Bi-Sb sample in magnetic fields and influence of sample geometry

The influence of sample geometry on measured physical properties (the magneto-Seebeck effect, Nernsteffect, magnetoresistance effect, Hall effect, and thermal conductivity) in a magnetic field was investigated fora polycrystalline Bi-Sb sample. The polycrystalline Bi88Sb12 bulk sample was prepared u...

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Published inThe Journal of the Thermoelectrics Society of Japan Vol. 20; no. 2; pp. 67 - 74
Main Authors Suzuki, Mari, Aoyama, Kayo, Yamamoto, Atsushi, Hasegawa, Yasuhiro, Komine, Takashi, Ohshima, Hironori, Nagase, Kazuo, Murata, Masayuki
Format Journal Article
LanguageJapanese
Published The Thermoelectrics Society of Japan 06.10.2023
一般社団法人 日本熱電学会
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ISSN1349-4279
2436-5068
DOI10.50972/thermoelectrics.20.2_67

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Summary:The influence of sample geometry on measured physical properties (the magneto-Seebeck effect, Nernsteffect, magnetoresistance effect, Hall effect, and thermal conductivity) in a magnetic field was investigated fora polycrystalline Bi-Sb sample. The polycrystalline Bi88Sb12 bulk sample was prepared using the spark plasmasintering method and annealing, and the physical properties obtained via measurements in magnetic fields of5 T were compared with the simulated values obtained by the finite element method with considering varioussample geometries. The appropriate shape required for the precise measurement of less than 2% error was foundto be different for each physical property: the required aspect ratio of length l to width w is l/w > 0.57 for the magnetoresistance effect, l/w > 2.9 for the Hall effect, l/w > 4.2 for the two-wire magneto-Seebeck effect, l/w > 1.2for the four-wire magneto-Seebeck effect, and l/w > 3.1 for the Nernst effect. We also found that a small error ofless than 2% in the thermal conductivity measurement requires Ks/Kw > 27, where Ks and Kw represent the thermalconductance of sample and that of lead wire, respectively.
ISSN:1349-4279
2436-5068
DOI:10.50972/thermoelectrics.20.2_67