ナノビーム電子線を用いた極微構造解析とイメージング(1)
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| Published in | 電子顕微鏡 Vol. 34; no. 2; pp. 135 - 140 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | Japanese |
| Published |
公益社団法人 日本顕微鏡学会
31.07.1999
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| Subjects | |
| Online Access | Get full text |
| ISSN | 0417-0326 |
| DOI | 10.11410/kenbikyo1950.34.135 |
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| Author | 田中, 信夫 弘津, 禎彦 |
|---|---|
| Author_xml | – sequence: 1 fullname: 田中, 信夫 organization: 名古屋大学大学院工学研究科 – sequence: 1 fullname: 弘津, 禎彦 organization: 大阪大学産業科学研究所 |
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| DOI | 10.11410/kenbikyo1950.34.135 |
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| EndPage | 140 |
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| References | 3) マイクロアナリシスハンドブック:丸勢編(朝倉書店,1985 14) Ohkubo, T., Hirotsu, Y. and Matsushita, M.: J. Electron Microsc. to be published. 4) Uhleman, S. and Haider, M.: Ultramicrosc., 72, 109 (1998 15) Matsushita, M., Hirotsu, Y., Ohkubo, T. and Oikawa, T.: J. Electron Microsc., 45, 105 (1996 12) Vine, W.J., Vincent, R., Spellward, P. and Steeds, J.W.: Ultramicrosc., 41, 423 (1990 17) Hirotsu, Y., Ohkubo, T. Hara, N. and Sugiyama, M.: to be submitted. 8) 田中通義:電子顕微鏡,18,75(1983 2) Pennycook, S.J. and Jesson, D.E.: Phys. Rev. Lett., 64, 938 (1990 16) Matsushita, M., Hirotsu, Y., Anazawa, K., Ohkubo, T. and Oikawa, T.: Mater. Trans. JIM, 36, 822 (1995 7) 松田強,遠藤潤二,川崎猛,外村彰:電子顕微鏡,33,75(1998 11) Humphreys, C.: Prof. Int. Cong E.M. (Kyoto, 1986) vol.1, p.105. 6) Ohshima, C.: Adv. Colloid. Interface, 71/72, 353 (1997 13) Tanaka, N., Egi, M. and Kimoto, K.: Interface Science, 4, 181 (1997 1) 田中信夫:日本金属学会報,32,21(1992 5) Mook, H.W. and Kruit, P.: Proc. TARA '98 Meeting (Seattle, 1998 10) Tanaka, M.: J. Electron Microsc., 35, 314 (1986 9) Tanaka, M., Terauchi, M. and Tsuda, K.: "Convergent Beam Electron Diffraction" (I), (II), (III) (JEOL/Maruzen |
| References_xml | – reference: 8) 田中通義:電子顕微鏡,18,75(1983) – reference: 15) Matsushita, M., Hirotsu, Y., Ohkubo, T. and Oikawa, T.: J. Electron Microsc., 45, 105 (1996) – reference: 3) マイクロアナリシスハンドブック:丸勢編(朝倉書店,1985) – reference: 14) Ohkubo, T., Hirotsu, Y. and Matsushita, M.: J. Electron Microsc. to be published. – reference: 1) 田中信夫:日本金属学会報,32,21(1992) – reference: 4) Uhleman, S. and Haider, M.: Ultramicrosc., 72, 109 (1998) – reference: 2) Pennycook, S.J. and Jesson, D.E.: Phys. Rev. Lett., 64, 938 (1990) – reference: 11) Humphreys, C.: Prof. Int. Cong E.M. (Kyoto, 1986) vol.1, p.105. – reference: 6) Ohshima, C.: Adv. Colloid. Interface, 71/72, 353 (1997) – reference: 9) Tanaka, M., Terauchi, M. and Tsuda, K.: "Convergent Beam Electron Diffraction" (I), (II), (III) (JEOL/Maruzen) – reference: 16) Matsushita, M., Hirotsu, Y., Anazawa, K., Ohkubo, T. and Oikawa, T.: Mater. Trans. JIM, 36, 822 (1995) – reference: 5) Mook, H.W. and Kruit, P.: Proc. TARA '98 Meeting (Seattle, 1998) – reference: 7) 松田強,遠藤潤二,川崎猛,外村彰:電子顕微鏡,33,75(1998) – reference: 13) Tanaka, N., Egi, M. and Kimoto, K.: Interface Science, 4, 181 (1997) – reference: 17) Hirotsu, Y., Ohkubo, T. Hara, N. and Sugiyama, M.: to be submitted. – reference: 12) Vine, W.J., Vincent, R., Spellward, P. and Steeds, J.W.: Ultramicrosc., 41, 423 (1990) – reference: 10) Tanaka, M.: J. Electron Microsc., 35, 314 (1986) |
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| SubjectTerms | ナノビーム回折(NBD) ナノビーム電子線 ナノ回折 収束電子回折(CBED) 走査透過電子顕微鏡(STEM) |
| Title | ナノビーム電子線を用いた極微構造解析とイメージング(1) |
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