Nanoscale mapping of excitonic processes in single-layer MoS2 using tip-enhanced photoluminescence microscopy

In two-dimensional (2D) semiconductors, photoluminescence originating from recombination processes involving neutral electron-hole pairs (excitons) and charged complexes (trions) is strongly affected by the localized charge transfer due to inhomogeneous interactions with the local environment and su...

Full description

Saved in:
Bibliographic Details
Published inNanoscale Vol. 8; no. 20; p. 10564
Main Authors Su, Weitao, Kumar, Naresh, Mignuzzi, Sandro, Crain, Jason, Roy, Debdulal
Format Journal Article
LanguageEnglish
Published England 19.05.2016
Online AccessGet full text

Cover

Abstract In two-dimensional (2D) semiconductors, photoluminescence originating from recombination processes involving neutral electron-hole pairs (excitons) and charged complexes (trions) is strongly affected by the localized charge transfer due to inhomogeneous interactions with the local environment and surface defects. Herein, we demonstrate the first nanoscale mapping of excitons and trions in single-layer MoS2 using the full spectral information obtained via tip-enhanced photoluminescence (TEPL) microscopy along with tip-enhanced Raman spectroscopy (TERS) imaging of a 2D flake. Finally, we show the mapping of the PL quenching centre in single-layer MoS2 with an unprecedented spatial resolution of 20 nm. In addition, our research shows that unlike in aperture-scanning near field microscopy, preferential exciton emission mapping at the nanoscale using TEPL and Raman mapping using TERS can be obtained simultaneously using this method that can be used to correlate the structural and excitonic properties.
AbstractList In two-dimensional (2D) semiconductors, photoluminescence originating from recombination processes involving neutral electron-hole pairs (excitons) and charged complexes (trions) is strongly affected by the localized charge transfer due to inhomogeneous interactions with the local environment and surface defects. Herein, we demonstrate the first nanoscale mapping of excitons and trions in single-layer MoS2 using the full spectral information obtained via tip-enhanced photoluminescence (TEPL) microscopy along with tip-enhanced Raman spectroscopy (TERS) imaging of a 2D flake. Finally, we show the mapping of the PL quenching centre in single-layer MoS2 with an unprecedented spatial resolution of 20 nm. In addition, our research shows that unlike in aperture-scanning near field microscopy, preferential exciton emission mapping at the nanoscale using TEPL and Raman mapping using TERS can be obtained simultaneously using this method that can be used to correlate the structural and excitonic properties.In two-dimensional (2D) semiconductors, photoluminescence originating from recombination processes involving neutral electron-hole pairs (excitons) and charged complexes (trions) is strongly affected by the localized charge transfer due to inhomogeneous interactions with the local environment and surface defects. Herein, we demonstrate the first nanoscale mapping of excitons and trions in single-layer MoS2 using the full spectral information obtained via tip-enhanced photoluminescence (TEPL) microscopy along with tip-enhanced Raman spectroscopy (TERS) imaging of a 2D flake. Finally, we show the mapping of the PL quenching centre in single-layer MoS2 with an unprecedented spatial resolution of 20 nm. In addition, our research shows that unlike in aperture-scanning near field microscopy, preferential exciton emission mapping at the nanoscale using TEPL and Raman mapping using TERS can be obtained simultaneously using this method that can be used to correlate the structural and excitonic properties.
In two-dimensional (2D) semiconductors, photoluminescence originating from recombination processes involving neutral electron-hole pairs (excitons) and charged complexes (trions) is strongly affected by the localized charge transfer due to inhomogeneous interactions with the local environment and surface defects. Herein, we demonstrate the first nanoscale mapping of excitons and trions in single-layer MoS2 using the full spectral information obtained via tip-enhanced photoluminescence (TEPL) microscopy along with tip-enhanced Raman spectroscopy (TERS) imaging of a 2D flake. Finally, we show the mapping of the PL quenching centre in single-layer MoS2 with an unprecedented spatial resolution of 20 nm. In addition, our research shows that unlike in aperture-scanning near field microscopy, preferential exciton emission mapping at the nanoscale using TEPL and Raman mapping using TERS can be obtained simultaneously using this method that can be used to correlate the structural and excitonic properties.
Author Kumar, Naresh
Roy, Debdulal
Mignuzzi, Sandro
Su, Weitao
Crain, Jason
Author_xml – sequence: 1
  givenname: Weitao
  surname: Su
  fullname: Su, Weitao
  organization: Institute of Materials Physics, Hangzhou Dianzi University, 310018, Hangzhou, China and Key Laboratory of RF Circuits and Systems (Hangzhou Dianzi University), Ministry of Education of China, China
– sequence: 2
  givenname: Naresh
  surname: Kumar
  fullname: Kumar, Naresh
  email: debdulal.roy@npl.co.uk
  organization: National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK. debdulal.roy@npl.co.uk
– sequence: 3
  givenname: Sandro
  surname: Mignuzzi
  fullname: Mignuzzi, Sandro
  email: debdulal.roy@npl.co.uk
  organization: National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK. debdulal.roy@npl.co.uk
– sequence: 4
  givenname: Jason
  surname: Crain
  fullname: Crain, Jason
  email: debdulal.roy@npl.co.uk
  organization: National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK. debdulal.roy@npl.co.uk and School of Physics and Astronomy, University of Edinburgh, James Clerk Maxwell Building, Peter Guthrie Tait Road, Edinburgh, EH9 3FD, UK
– sequence: 5
  givenname: Debdulal
  surname: Roy
  fullname: Roy, Debdulal
  email: debdulal.roy@npl.co.uk
  organization: National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK. debdulal.roy@npl.co.uk
BackLink https://www.ncbi.nlm.nih.gov/pubmed/27152366$$D View this record in MEDLINE/PubMed
BookMark eNpNUMtOwzAQtFARfcCFD0A-cgn4kfhxRBUvqcABOEeOs6GuHDvEiUT_niCKxGlnZ0Y7o12iWYgBEDqn5IoSrq9tEXoiuVTVEVowkpOMc8lm__AcLVPaESI0F_wEzZmkBeNCLFD7bEJM1njArek6Fz5wbDB8WTfE4Czu-mghJUjYBZwm2UPmzR56_BRfGR5_KDy4LoOwNcFCjbttHKIfWxcgWZgo3DrbTxmx25-i48b4BGeHuULvd7dv64ds83L_uL7ZZDsm5ZCxghaCEKtVwXVeV6auaSOpFlzLhgGhSk5bZUWhGkYp58oqInWuRVMRDYyv0OXv3an-5whpKFs3lfHeBIhjKqnUJC84I2qyXhysY9VCXXa9a02_L_9exL8B4a5qJw
ContentType Journal Article
DBID NPM
7X8
DOI 10.1039/c5nr07378b
DatabaseName PubMed
MEDLINE - Academic
DatabaseTitle PubMed
MEDLINE - Academic
DatabaseTitleList MEDLINE - Academic
PubMed
Database_xml – sequence: 1
  dbid: NPM
  name: PubMed
  url: https://proxy.k.utb.cz/login?url=http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed
  sourceTypes: Index Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 2040-3372
ExternalDocumentID 27152366
Genre Journal Article
GroupedDBID ---
0-7
0R~
29M
4.4
53G
705
7~J
AAEMU
AAIWI
AAJAE
AANOJ
AARTK
AAWGC
AAXHV
ABASK
ABDVN
ABEMK
ABJNI
ABPDG
ABRYZ
ABXOH
ACGFS
ACIWK
ACLDK
ADMRA
ADSRN
AEFDR
AENEX
AENGV
AESAV
AETIL
AFLYV
AFOGI
AFRDS
AFRZK
AFVBQ
AGEGJ
AGRSR
AHGCF
AKBGW
ALMA_UNASSIGNED_HOLDINGS
ALUYA
ANBJS
ANUXI
APEMP
ASKNT
AUDPV
AZFZN
BLAPV
BSQNT
C6K
DU5
EBS
ECGLT
EE0
EF-
EJD
F5P
GGIMP
H13
HZ~
H~N
J3I
NPM
O-G
O9-
OK1
P2P
RAOCF
RCNCU
RNS
RPMJG
RSCEA
RVUXY
7X8
AKMSF
ID FETCH-LOGICAL-j277t-2515600c985394dbadd1f7196397f2e0187719bc658f211338c8079496fb09e23
ISSN 2040-3372
IngestDate Fri Jul 11 01:45:22 EDT 2025
Thu Apr 03 06:59:30 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 20
Language English
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-j277t-2515600c985394dbadd1f7196397f2e0187719bc658f211338c8079496fb09e23
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
PMID 27152366
PQID 1790453208
PQPubID 23479
ParticipantIDs proquest_miscellaneous_1790453208
pubmed_primary_27152366
PublicationCentury 2000
PublicationDate 2016-May-19
PublicationDateYYYYMMDD 2016-05-19
PublicationDate_xml – month: 05
  year: 2016
  text: 2016-May-19
  day: 19
PublicationDecade 2010
PublicationPlace England
PublicationPlace_xml – name: England
PublicationTitle Nanoscale
PublicationTitleAlternate Nanoscale
PublicationYear 2016
SSID ssj0069363
Score 2.4838016
Snippet In two-dimensional (2D) semiconductors, photoluminescence originating from recombination processes involving neutral electron-hole pairs (excitons) and charged...
SourceID proquest
pubmed
SourceType Aggregation Database
Index Database
StartPage 10564
Title Nanoscale mapping of excitonic processes in single-layer MoS2 using tip-enhanced photoluminescence microscopy
URI https://www.ncbi.nlm.nih.gov/pubmed/27152366
https://www.proquest.com/docview/1790453208
Volume 8
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3JTsMwELVYLnBA7JRNRuJWBRI7zXIExCIQXKCCW5W4DgTRJGpTCfXrmXGcpSwScInaRG0kz_PzeObNmJBDbuMqITyjj3ocGyaQAVuwPgrXQjvsW6ZU3fVv75yrrn391HmqdbqquiQPj8Tk27qS_1gV7oFdsUr2D5at_hRuwGewL1zBwnD9lY2BGtMRDDKKULNM65flu4BZiufaZEURgJJctTEm8CaNtwB8bJjJ96w9VmGCPM4MmbwUQoDsJc2RrlALL9ScH6BgD0tXptK_1YvrnJIS68k4D9I6O6TV23dY41SFnW_j52Q8mcRFPBr7JVR5kGGgzwYLRhotOh5hOZhK16wnFW8xFCly7k6RrNfAEjMbjAn-XdHG_AuXmxxboYpOMgQacr0pwgc7ZANlVeaCB8KdT-201QJdPpol8ww2EcCC8yc3p5eP5Urt-NzhZcta7h_Xr8IW0frHP-88lAfysEyW9NaBnhQ4WCEzMlkli42GkmtkUBmGakTQNKIVImiFCBontIkIioigChG0iQj6BRG0RsQ66V6cP5xdGfpADeMVBiA3wJdFB1f44KP5dj-Etc2KXORg342YxPMZ4VsowCuNmIXRC-GZQNi-E4WmLxnfIHNJmsgtLPWHZ67LBY9C9EHRsRTMFtKKBPC6bJGDcth6QFiYhQoSmY5HPWwJZ-NxJF6LbBbj2cuKziq9ctC3f3yyQxZq0O2SuXw4lnvgFubhvrbuB7yqZ38
linkProvider Royal Society of Chemistry
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Nanoscale+mapping+of+excitonic+processes+in+single-layer+MoS2+using+tip-enhanced+photoluminescence+microscopy&rft.jtitle=Nanoscale&rft.au=Su%2C+Weitao&rft.au=Kumar%2C+Naresh&rft.au=Mignuzzi%2C+Sandro&rft.au=Crain%2C+Jason&rft.date=2016-05-19&rft.eissn=2040-3372&rft.volume=8&rft.issue=20&rft.spage=10564&rft_id=info:doi/10.1039%2Fc5nr07378b&rft_id=info%3Apmid%2F27152366&rft.externalDocID=27152366
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2040-3372&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2040-3372&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2040-3372&client=summon