Modeling mark edge jitter in phase change recording

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Bibliographic Details
Published inOptical data storage 2000 : 14-17 May, 2000, Whistler, Canada pp. 116 - 121
Main Authors SHEILA, Aparna C, LAMBETH, D. N, SCHLESINGER, T. E
Format Conference Proceeding
LanguageEnglish
Japanese
Published Bellingham WA SPIE 18.09.2000
Subjects
Applied sciences
Electronics
Exact sciences and technology
Magnetic and optical mass memories
Storage and reproduction of information
Crystal growth
Waveform
Temperature distribution
Optical disk
Nucleation
Heat equation
Reflecting thin film
Jitter
Layer thickness
Data logging
Phase change materials
Statistical method
Experimental result
Optical recording
Diffusion equation
Simulation model
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ISBN:0819437336
9780819437334
DOI:10.1117/12.399338