Fluorescent X-ray method for determination of manganese in stainless steel with correction for overlapping spectrum
In the fluorescent X-ray analysis for manganese in stainless steel, the disturbing influence of overlapping CrKβ line giving higher background to MnKα peak was removed by subtracting the CrKβ intensity calculated from the line intensity of CrKα always obtained on stainless steels. This method was fo...
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| Published in | BUNSEKI KAGAKU Vol. 11; no. 12; pp. 1273 - 1279 |
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| Main Author | |
| Format | Journal Article |
| Language | Japanese |
| Published |
The Japan Society for Analytical Chemistry
05.12.1962
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| Online Access | Get full text |
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| Summary: | In the fluorescent X-ray analysis for manganese in stainless steel, the disturbing influence of overlapping CrKβ line giving higher background to MnKα peak was removed by subtracting the CrKβ intensity calculated from the line intensity of CrKα always obtained on stainless steels. This method was found to be most suitable for routine analysis with rapidity, simpleness and satisfactorily high accuracy. The correction formula, Mn% = k(IMnKα + αICrKα)+C, was derived from the X-ray spectrum characteristics for pure metallic chromium and manganese. Good results were obtained for 0.042.7% manganese in 90 samples containing 1.534% Cr, 820% Ni and 04% Mo with the standard deviation of less than 0.04%. |
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| ISSN: | 0525-1931 |
| DOI: | 10.2116/bunsekikagaku.11.1273 |