Defect analysis for homoepitaxial GaN thick films grown by OVPE method
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Published in | JSAP Annual Meetings Extended Abstracts p. 3212 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | Japanese |
Published |
The Japan Society of Applied Physics
25.02.2019
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Subjects | |
Online Access | Get more information |
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Bibliography: | 12a-W541-8 |
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ISSN: | 2436-7613 |
DOI: | 10.11470/jsapmeeting.2019.1.0_3212 |