Artificial Bee Colony Optimization to Accelerate High-Speed Serial I/O Tx Equalization
A critical activity during electrical testing for High-Speed Serial l/O is the search for optimal Tx equalization settings that yield the cleanest eye diagram possible. Typical practices consist of performing an exhaustive grid search over two variables to define the best solution region, known as t...
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Published in | Proceedings - IEEE VLSI Test Symposium pp. 1 - 5 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
28.04.2025
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Subjects | |
Online Access | Get full text |
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