ML-based Adaptive Wafer Sort to Preserve Diagnostic Information

• Published in: Proceedings - IEEE VLSI Test Symposium pp. 1 - 7
• Main Authors: Liu, Yun-Sheng, Liu, Min-Hsin, Li, James Chien-Mo
• Format: Conference Proceeding
• Language: English
• Published: IEEE 28.04.2025
• Subjects: Adaptation models; adaptive tests; Complexity theory; Faces; Hands; Machine learning; Measurement; Predictive models; test time reduction; Testing; Very large scale integration
• ISSN: 2375-1053
• DOI: 10.1109/VTS65138.2025.11022782

As the complexity of integrated circuits advances, wafer sort faces the difficulty of balancing test time, test quality, and the preservation of diagnostic information. On the one hand, we need a high-quality wafer sort that detects defective chips at the early test stage. On the other hand, high-qu...