Investigating the Factors Influencing Image Formation in Scanning Electron Microscopy

Scanning electron microscopy (SEM) is a powerful imaging tool used to investigate the morphological capabilities of a variety of samples with a decision at the Nano scale. The electron optics of SEM instruments allows them to shape photos from pondered and secondary electrons generated upon sample i...

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Bibliographic Details
Published inInternational Conference on Computing, Communication, and Networking Technologies (Online) pp. 1 - 6
Main Authors Vijayalakshmi, V.J., Katyal, Ashu, K, Divya, Kansal, Amit, Dasarathy, A. K, Sharma, Nakul S.
Format Conference Proceeding
LanguageEnglish
Published IEEE 24.06.2024
Subjects
Applications
Capabilities
Electron beams
Imaging
Instruments
Investigate
Knowledge engineering
Life estimation
Parameters
Radiation effects
Scanning
Scanning electron microscopy
Shape
Surface charging
Surface morphology
Voltage
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ISSN2473-7674
DOI10.1109/ICCCNT61001.2024.10724017

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Summary:Scanning electron microscopy (SEM) is a powerful imaging tool used to investigate the morphological capabilities of a variety of samples with a decision at the Nano scale. The electron optics of SEM instruments allows them to shape photos from pondered and secondary electrons generated upon sample irradiation with a primary electron beam. The transmission of the electron beam via the sample and its interplay with the surface atoms, in large part, decide the ensuing image, alongside other elements along with detection geometry, specimen charging, and history degree. Information on how these elements engage and their impact on the ensuing picture are vital in extracting useful statistics from SEM pictures. In this observation, we tested the effect of various beam energies, tensions, and accelerations on sample photograph formation and the resulting variation in evaluation and sign intensity. The outcomes of this look can be used to optimize SEM imaging parameters and symbolize the imaging manner wished for diverse applications within the subject.
ISSN:2473-7674
DOI:10.1109/ICCCNT61001.2024.10724017