Parasitic bipolar impact in 32nm undoped channel Ultra-Thin BOX (UTBOX) and biased ground plane FDSOI high-k/metal gate technology
In this paper we explore the impact of the parasitic bipolar in undoped channel Ultra-Thin BOX (UTBOX) with and without Ground Plane (GP) on a 32nm Fully-Depleted SOI (FDSOI) high-k/metal gate technology. The static parasitic bipolar latch occurs at a drain bias superior to the circuit operation ali...
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Published in | 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) pp. 111 - 114 |
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Main Authors | , , , , , , , , , , , , , , , , , , , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.09.2011
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Subjects | |
Online Access | Get full text |
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Summary: | In this paper we explore the impact of the parasitic bipolar in undoped channel Ultra-Thin BOX (UTBOX) with and without Ground Plane (GP) on a 32nm Fully-Depleted SOI (FDSOI) high-k/metal gate technology. The static parasitic bipolar latch occurs at a drain bias superior to the circuit operation alimentation. The several type of ground plane and forward or reverse back biasing don't modify significantly the bipolar breakdown voltage. The thicker EOT gate oxide is more sensible to parasitic bipolar breakdown. Finally, results have been reinforced by using calibrated TCAD simulation tool. |
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ISBN: | 9781457707070 1457707071 |
ISSN: | 1930-8876 |
DOI: | 10.1109/ESSDERC.2011.6044222 |