Dielectric strength of series - connected vacuum GAPS

The paper presents techniques and formulas for calculation of the electric strength of a facility with a random number of series connected vacuum gaps.

Saved in:
Bibliographic Details
Published inXXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV Vol. 1; pp. 68 - 71
Main Authors Sidorov, V.A., Alferov, D.F., Alferova, E.D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2004
Subjects
Breakdown voltage
Dielectric breakdown
Dielectrics and electrical insulation
Electric breakdown
Interrupters
Probability
Semiconductor devices
Sulfur hexafluoride
Switches
Vacuum technology
Online AccessGet full text

Cover

More Information
Summary:The paper presents techniques and formulas for calculation of the electric strength of a facility with a random number of series connected vacuum gaps.
ISBN:9780780384613
078038461X
ISSN:1093-2941
DOI:10.1109/DEIV.2004.1418603