Frequency comb metrology at PHz frequencies: Precision in the extreme ultraviolet

The capability of frequency-comb (FC) lasers to precisely measure optical frequencies is extended to the multiple-PHz domain. This frequency region, which covers the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), was previously not accessible to these devices. Frequency comb generation...

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Bibliographic Details
Published in2011 XXXth URSI General Assembly and Scientific Symposium pp. 1 - 4
Main Authors Gohle, Ch, Kandula, D. Z., Pinkert, T. J., Morgenweg, J., Barmes, I., Ubachs, W., Eikema, K. S. E.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2011
Subjects
Frequency modulation
Helium
Metrology
Ultraviolet sources
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Summary:The capability of frequency-comb (FC) lasers to precisely measure optical frequencies is extended to the multiple-PHz domain. This frequency region, which covers the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), was previously not accessible to these devices. Frequency comb generation is shown for 51-85 nm by amplification and coherent up-conversion of a pair of pulses originating from a near-infrared femtosecond FC laser. Moreover, Ramsey-like signals with up to 61% contrast are observed when the XUV comb is scanned over transitions in argon, neon and helium, resulting in an 8-fold improved determination of the ground state ionization energy of helium.
ISBN:1424451175
9781424451173
DOI:10.1109/URSIGASS.2011.6050328