Back-projection cortical potential imaging: A sensitivity study

In this work we inspect and validate the back-projection cortical potential imaging (BP-CPI) technique. The BP-CPI is a relatively new tool which estimates highly detailed cortical potential distributions from the smeared measured EEG spatial signals. The testing of this tool includes the study of t...

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Bibliographic Details
Published in2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS) pp. 1 - 5
Main Authors Haor, Dror, Shavit, Reuven, Peremen, Ziv, Stern, Yaki, Geva, Amir
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2017
Subjects
back-projection
Cortical potential imaging
Electric potential
Electrodes
Electroencephalography
inverse problem
Microwave antennas
Scalp
Sensitivity
Signal to noise ratio
simulative validation
surface Laplacian
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Summary:In this work we inspect and validate the back-projection cortical potential imaging (BP-CPI) technique. The BP-CPI is a relatively new tool which estimates highly detailed cortical potential distributions from the smeared measured EEG spatial signals. The testing of this tool includes the study of the BP-CPI sensitivity to real-life interferences and errors, such as electrodes noise, displacement errors, and the number of electrodes. This was done through a series of computer simulations (performed using Sim4Life by ZMT) solving scalp and cortical potential distributions excited by three source configurations. Examining the results in this sensitivity study, it is clear that the BP-CPI technique provides a useful tool for recovering the cortical potential underlying within the subject head.
DOI:10.1109/COMCAS.2017.8244801