Degradation Analysis and Mitigation in FPGAs

FPGAs are powerful platforms for investigating impending challenges associated with process scaling, such as variation and degradation. Their versatility allows us to gather empirical data and evaluate novel solutions. We carried out accelerated-life tests on modern FPGA devices and obtained a usefu...

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Bibliographic Details
Published in2010 International Conference on Field Programmable Logic and Applications pp. 428 - 433
Main Authors Stott, E, Wong, J S J, Cheung, P Y K
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2010
Subjects
Aging
Degradation
Fault-tolerance
Field programmable gate arrays
FPGA
Integrated circuit interconnections
NBTI
reliability
self-test
Stress
Table lookup
Timing
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Summary:FPGAs are powerful platforms for investigating impending challenges associated with process scaling, such as variation and degradation. Their versatility allows us to gather empirical data and evaluate novel solutions. We carried out accelerated-life tests on modern FPGA devices and obtained a useful characterisation of the ageing processes that afflict them. We also quantified the potential benefits of three degradation mitigation strategies based on exploiting spare logic and interconnect resources. The work helps cement the role of reconfigurable logic as a vitally-important technology in the face of the uncertainties of future process scaling.
ISBN:9781424478422
1424478421
ISSN:1946-147X
1946-1488
DOI:10.1109/FPL.2010.88