An improved X-filling strategy based on the Multilayer Data Copy scheme for test data and power reduction for SoC

Multilayer Data Copy (MDC) [1] is an effective test data compression scheme for achieving low shift-in power for the multiple scan chain of SoC. This work improves the scheme by employing a B-filling strategy to fill X (don't care) bits to further reduce the test data volume and the test power....

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Bibliographic Details
Published in2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology pp. 1 - 3
Main Authors Qing Zhao, Xiao Le Cui, Chung Len Lee
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2012
Subjects
Decoding
Filling
low power
Nonhomogeneous media
SoC testing
System-on-a-chip
Test data compression
test pattern generation
Testing
Very large scale integration
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Summary:Multilayer Data Copy (MDC) [1] is an effective test data compression scheme for achieving low shift-in power for the multiple scan chain of SoC. This work improves the scheme by employing a B-filling strategy to fill X (don't care) bits to further reduce the test data volume and the test power. Experimental results show that it can achieve more 3% of the test data volume reduction and more than two times of power savings on benchmark circuits.
ISBN:9781467324748
1467324744
DOI:10.1109/ICSICT.2012.6467880