Improved method to determine supercapacitor metrics from highpass filter response
An improved method for the extraction of supercapacitor metrics from a high pass filter response is proposed. Only Magnitude measurements at three different frequencies are required in order to extract the fractional-order model parameters of a supercapacitor. Experimental results from commercial 1F...
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Published in | 2016 28th International Conference on Microelectronics (ICM) pp. 25 - 28 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.12.2016
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Subjects | |
Online Access | Get full text |
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Summary: | An improved method for the extraction of supercapacitor metrics from a high pass filter response is proposed. Only Magnitude measurements at three different frequencies are required in order to extract the fractional-order model parameters of a supercapacitor. Experimental results from commercial 1F supercapacitors are presented and discussed with error analysis performed on the data. |
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DOI: | 10.1109/ICM.2016.7847898 |