Damp heat versus field reliability for crystalline silicon

This paper demonstrates a multi-stress time-to-failure analysis of selected silicon PV cells due to metallic corrosion. This work indicates that the time-to-failure is a system effect and the kinetics of the reactions are different for different cells.

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Bibliographic Details
Published in2012 38th IEEE Photovoltaic Specialists Conference pp. 001864 - 001870
Main Authors Whitfield, K., Salomon, A., Shuying Yang, Suez, I.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2012
Subjects
Acceleration models
damp heat
degradation modeling
DH-HEMTs
Heating
Indexes
reliability
service lifetime prediction
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Summary:This paper demonstrates a multi-stress time-to-failure analysis of selected silicon PV cells due to metallic corrosion. This work indicates that the time-to-failure is a system effect and the kinetics of the reactions are different for different cells.
ISBN:1467300640
9781467300643
ISSN:0160-8371
DOI:10.1109/PVSC.2012.6317957