Damp heat versus field reliability for crystalline silicon
This paper demonstrates a multi-stress time-to-failure analysis of selected silicon PV cells due to metallic corrosion. This work indicates that the time-to-failure is a system effect and the kinetics of the reactions are different for different cells.
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Published in | 2012 38th IEEE Photovoltaic Specialists Conference pp. 001864 - 001870 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.06.2012
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Subjects | |
Online Access | Get full text |
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Summary: | This paper demonstrates a multi-stress time-to-failure analysis of selected silicon PV cells due to metallic corrosion. This work indicates that the time-to-failure is a system effect and the kinetics of the reactions are different for different cells. |
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ISBN: | 1467300640 9781467300643 |
ISSN: | 0160-8371 |
DOI: | 10.1109/PVSC.2012.6317957 |