Accurate Measurement for Surface Resistance of a Single Piece of HTS Thin Film

An improved image type sapphire resonator was developed for accurate measurement of surface resistance of a single piece of high temperature superconductor thin film. The surface resistances of two DC spurting yttrium-barium-copper oxide (YBCO) thin films were measured by TE 011 mode of this resonat...

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Bibliographic Details
Published in2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis pp. 1 - 4
Main Authors Cheng Zeng, Zhengxiang Luo, Kai Yang, Qishao Zhang
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.04.2009
Subjects
Electrical resistance measurement
Frequency dependence
Frequency measurement
High temperature superconductors
Superconducting thin films
Surface resistance
Tellurium
Transistors
Yttrium barium copper oxide
Yttrium compounds
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Summary:An improved image type sapphire resonator was developed for accurate measurement of surface resistance of a single piece of high temperature superconductor thin film. The surface resistances of two DC spurting yttrium-barium-copper oxide (YBCO) thin films were measured by TE 011 mode of this resonator. TE 012 mode of this resonator was also used in the measurement for the determination of the frequency dependence of the surface resistance of the HTS thin film. The high accuracy in the R s measurement of this resonator is comparable to the one of conventional two-resonator method, while the process is much simpler. The ability for measuring surface resistance of a single HTS thin film and characterizing the frequency dependence of R s of this sapphire resonator is remarkable.
ISBN:1424425875
9781424425877
ISSN:2324-8475
DOI:10.1109/CAS-ICTD.2009.4960774