Determination of high frequency package currents from near-field scan data

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Bibliographic Details
Published in	2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005 Vol. 3; pp. 679 - 683
Main Authors	Xiaopeng Dong, Shaowei Deng, Beetner, D.G., Hubing, T.H., Van Doren, T.P.
Format	Conference Proceeding
Language	English
Published	IEEE 2005
Subjects	Current distribution Current measurement Electromagnetic interference Electronics packaging Frequency Integrated circuit packaging Magnetic field measurement Magnetic fields Probes Semiconductor device measurement
Online Access	Get full text

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