Novel emitter controlled diode with copper metallization in ultrathin wafer technology: Setting a performance benchmark

Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper metallization are shown.

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Published in2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) pp. 121 - 122
Main Authors Rodriguez, F.J. Santos, Schloegl, D., Hille, F., Brandt, P.C., Pfaffenlehner, M., Stegner, A.R., Haertl, A.
Format Conference Proceeding
LanguageEnglish
Published IEEJ 01.05.2017
Subjects
freewheeling diode
ultrathin wafer
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Abstract Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper metallization are shown.
AbstractList Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper metallization are shown.
Author Schloegl, D.
Haertl, A.
Rodriguez, F.J. Santos
Pfaffenlehner, M.
Stegner, A.R.
Hille, F.
Brandt, P.C.
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  givenname: F.J. Santos
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  email: francisco.santosrodriguez@infineon.com
  organization: Infineon Technologies Austria AG, Villach, Austria
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  surname: Schloegl
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  organization: Infineon Technologies Austria AG, Villach, Austria
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  surname: Hille
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  organization: Infineon Technologies AG, Munich, Germany
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  surname: Brandt
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  organization: Infineon Technologies AG, Munich, Germany
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  surname: Pfaffenlehner
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  organization: Infineon Technologies AG, Munich, Germany
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  surname: Stegner
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  organization: Infineon Technologies AG, Munich, Germany
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  givenname: A.
  surname: Haertl
  fullname: Haertl, A.
  email: andreas.haertl@infineon.com
  organization: Infineon Technologies AG, Munich, Germany
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Snippet Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper...
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StartPage 121
SubjectTerms freewheeling diode
ultrathin wafer
Title Novel emitter controlled diode with copper metallization in ultrathin wafer technology: Setting a performance benchmark
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