Novel emitter controlled diode with copper metallization in ultrathin wafer technology: Setting a performance benchmark
Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper metallization are shown.
Saved in:
Published in | 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) pp. 121 - 122 |
---|---|
Main Authors | , , , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEJ
01.05.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper metallization are shown. |
---|---|
ISBN: | 488686094X 9784886860941 |
ISSN: | 1946-0201 |
DOI: | 10.23919/ISPSD.2017.7988941 |