Novel emitter controlled diode with copper metallization in ultrathin wafer technology: Setting a performance benchmark

Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper metallization are shown.

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Bibliographic Details
Published in2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) pp. 121 - 122
Main Authors Rodriguez, F.J. Santos, Schloegl, D., Hille, F., Brandt, P.C., Pfaffenlehner, M., Stegner, A.R., Haertl, A.
Format Conference Proceeding
LanguageEnglish
Published IEEJ 01.05.2017
Subjects
freewheeling diode
ultrathin wafer
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Summary:Electrical characterization results (e.g. softness, cosmic ray hardness, surge current) of a novel freewheeling diode with reduced thickness and copper metallization are shown.
ISBN:488686094X
9784886860941
ISSN:1946-0201
DOI:10.23919/ISPSD.2017.7988941