Assessment and foundation of testability growth model with gamma rectifying delay function

In this paper, a STGM (system testability growth model) considering the rectifying process of TDLs (testability design limitations) are proposed. Firstly, the simulation result based on a set of testability test data indicates that the delay relation between identifying and removing process of TDLs...

Full description

Saved in:
Bibliographic Details
Published in2017 Prognostics and System Health Management Conference (PHM-Harbin) pp. 1 - 6
Main Authors Li, Tianmei, Yang, Zonghao, Xu, Congqi, Xu, Congan
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2017
Subjects
Circuit faults
Debugging
Delays
Fault diagnosis
Gamma curve
rectifying delay
Simulation
Testability design limitations
Testability growth model
Tracking
Online AccessGet full text

Cover

More Information
Summary:In this paper, a STGM (system testability growth model) considering the rectifying process of TDLs (testability design limitations) are proposed. Firstly, the simulation result based on a set of testability test data indicates that the delay relation between identifying and removing process of TDLs obeys a Bell-shaped curve. Furthermore, the TGM based on a Bell-shaped curve(Gamma curve) is studied. Finally, Results from applications to a real data set are analyzed, and the testability prediction capability are evaluated, the result show that the TGM considering the rectifying delay can significantly improve the accuracy of tracking and predicting in the testability growth test, the accuracy is 10 -3 order of magnitudes.
ISSN:2166-5656
DOI:10.1109/PHM.2017.8079173