Quantum efficiency simulations from on-line compatible mapping of thin-film solar cells

• Published in: 2011 37th IEEE Photovoltaic Specialists Conference pp. 002241 - 002246
• Main Authors: Aryal, P., Chen, J., Huang, Z., Dahal, L. R., Sestak, M. N., Attygalle, D., Jacobs, R., Ranjan, V., Marsillac, S., Collins, R. W.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.06.2011
• Subjects: Glass; Optical films; Optical reflection; Optical sensors; Photovoltaic cells; Wavelength measurement
• ISBN: 9781424499663; 1424499666
• ISSN: 0160-8371
• DOI: 10.1109/PVSC.2011.6186402

Through-the-glass and film side spectroscopic ellipsometry (SE) are being developed as in situ, on-line, and off-line mapping tools for large area thin film photovoltaics. Given that such instrumentation allows one to extract thicknesses, as well as parameterized optical functions versus wavelength, there exists the possibility to utilize this information further to predict the optical quantum efficiency (QE) and optical losses, the latter including the reflectance and inactive layer absorbances. By spatially resolving this information, one can gain a better understanding of the origin of performance differences between small area cells and large area modules. We have demonstrated these techniques for thin film hydrogenated amorphous silicon (a-Si:H) and Cu(In 1-x Ga x )Se 2 solar cell structures. For solar cells on glass superstrates, film-side SE can be supplemented with through-the-glass SE, which helps to increase the sensitivity of the analysis to the critical transparent conducting oxide and window layer properties. A comparison of predicted and experimental QE can reveal optical and electronic losses and light trapping gains.