Layout debugging demonstration by FIB circuit edit
The FIB circuit editing is widely used in FA field, such as debugging, root cause demonstration and validating design changes. In this study, we will demonstrate the ability and benefit for circuit debugging, and the loading effect assumption was demonstrated by FIB circuit editing that the solution...
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Published in | 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits pp. 1 - 4 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.07.2010
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Subjects | |
Online Access | Get full text |
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Summary: | The FIB circuit editing is widely used in FA field, such as debugging, root cause demonstration and validating design changes. In this study, we will demonstrate the ability and benefit for circuit debugging, and the loading effect assumption was demonstrated by FIB circuit editing that the solution would easily be made. Meanwhile, the advanced circuit editing procedure will be introduced to improve the success rate in this investigation. |
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ISBN: | 9781424455966 1424455960 |
ISSN: | 1946-1542 1946-1550 |
DOI: | 10.1109/IPFA.2010.5531976 |