Layout debugging demonstration by FIB circuit edit

The FIB circuit editing is widely used in FA field, such as debugging, root cause demonstration and validating design changes. In this study, we will demonstrate the ability and benefit for circuit debugging, and the loading effect assumption was demonstrated by FIB circuit editing that the solution...

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Bibliographic Details
Published in2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits pp. 1 - 4
Main Authors Po Fu Chou, Chun Ming Tsai, Yu Hsiang Shu
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2010
Subjects
Chemicals
Circuit testing
Debugging
Electron beams
Etching
Failure analysis
Focusing
Ion beams
Particle beams
Scanning electron microscopy
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Summary:The FIB circuit editing is widely used in FA field, such as debugging, root cause demonstration and validating design changes. In this study, we will demonstrate the ability and benefit for circuit debugging, and the loading effect assumption was demonstrated by FIB circuit editing that the solution would easily be made. Meanwhile, the advanced circuit editing procedure will be introduced to improve the success rate in this investigation.
ISBN:9781424455966
1424455960
ISSN:1946-1542
1946-1550
DOI:10.1109/IPFA.2010.5531976