Design and DfT of a High-Speed Area-Efficient Embedded Asynchronous FIFO

Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module with asynchronous read and write clocks. The implementation is based on a micropipeline architecture and is at least a factor two smaller than S...

Full description

Saved in:
Bibliographic Details
Published in2007 Design, Automation & Test in Europe Conference & Exhibition pp. 1 - 6
Main Authors Wielage, P., Marinissen, E.J., Altheimer, M., Wouters, C.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.04.2007
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module with asynchronous read and write clocks. The implementation is based on a micropipeline architecture and is at least a factor two smaller than SRAM-based and standard-cell-based counterparts. This paper gives an overview of the most important design features of the new FIFO module and describes its test and design-for-test approach
AbstractList Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module with asynchronous read and write clocks. The implementation is based on a micropipeline architecture and is at least a factor two smaller than SRAM-based and standard-cell-based counterparts. This paper gives an overview of the most important design features of the new FIFO module and describes its test and design-for-test approach
Author Altheimer, M.
Wouters, C.
Wielage, P.
Marinissen, E.J.
Author_xml – sequence: 1
  givenname: P.
  surname: Wielage
  fullname: Wielage, P.
  organization: NXP Semicond., Eindhoven
– sequence: 2
  givenname: E.J.
  surname: Marinissen
  fullname: Marinissen, E.J.
  organization: NXP Semicond., Eindhoven
– sequence: 3
  givenname: M.
  surname: Altheimer
  fullname: Altheimer, M.
– sequence: 4
  givenname: C.
  surname: Wouters
  fullname: Wouters, C.
BookMark eNotjsFqAjEURUNroWq7L3STH4h9L8k4yVJ0rILgorOXTPKiKTUjM3bh31epqwvnwOGO2CC3mRh7Q5gggv1YzOpqIgHKiZpqZe0DG2JRGHGV-MhGyhoEAyjl4CYUCCwsPrNR338DQKGkHbLVgvq0z9zlwBex5m3kjq_S_iC-TkSBzzpyooox-UT5zKtjQyHceH_J_tC1uf3t-XK93L6wp-h-enq975jVy6qer8Rm-7mezzYiWTgLJ6OfRm3RN0ZDCA7gCkA1vixCNIXXhMaUU2qs9lLL6wWyTkoqNcrGBTVm7__ZRES7U5eOrrvstES0YNUfLgNNtg
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/DATE.2007.364399
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Computer Science
EISSN 1558-1101
EndPage 6
ExternalDocumentID 4211909
Genre orig-research
GroupedDBID 123
29F
29O
6IE
6IF
6IH
6IK
6IL
6IN
AAJGR
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
FEDTE
IEGSK
IPLJI
KZ1
LMP
M43
OCL
RIE
RIL
RNS
ID FETCH-LOGICAL-i90t-a2fc6f491cb840dda00fc603bc75df85c4e18876eb94c242eede9a22e7412bad3
IEDL.DBID RIE
ISBN 3981080122
9783981080124
ISSN 1530-1591
IngestDate Wed Jun 26 19:34:07 EDT 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-a2fc6f491cb840dda00fc603bc75df85c4e18876eb94c242eede9a22e7412bad3
PageCount 6
ParticipantIDs ieee_primary_4211909
PublicationCentury 2000
PublicationDate 2007-April
PublicationDateYYYYMMDD 2007-04-01
PublicationDate_xml – month: 04
  year: 2007
  text: 2007-April
PublicationDecade 2000
PublicationTitle 2007 Design, Automation & Test in Europe Conference & Exhibition
PublicationTitleAbbrev DATE
PublicationYear 2007
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0005329
ssj0000394159
Score 1.7813706
Snippet Embedded first-in first-out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded ripple-through FIFO module...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Automatic testing
Clocks
Communication system control
Design for testability
Integrated circuit testing
Marine technology
Network-on-a-chip
Pipelines
Random access memory
Software libraries
Title Design and DfT of a High-Speed Area-Efficient Embedded Asynchronous FIFO
URI https://ieeexplore.ieee.org/document/4211909
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELZKJ1gKbRFveWAkbfxIU48VTVWQCkgEqVtlO7aEEElFkwF-PeekCQ8xsCU35BInvrvY3_cdQpcklJrYgHk2gRDIBSee4sr3iCFKUKqVVY4ovLgbzZ_47TJYttBVw4UxxpTgMzNwh-VefpLpwi2VDbmTI3NsvZ1QiIqr1ayn-Az8uNRcwztY2aEMJjQ4DgRxvA4xdog6QmmlvNOc83r_0hfD6SSOKmVD5pK1-NF1pUw6sw5a1LdbYU1eBkWuBvrjl5Ljf59nH_W_6H34oUlcB6hl0i7q1P0d8Ha6d9HeN7HCHppPS7AHlmmCpzbGmcUSO5iI97iGK-EJlJ9eVCpSgFccvSoDQQ3sm_dUOwnerNjg2c3svo_iWRRfz71tHwbvWfi5J6nVI8sF0Qr-BpNE-j4YfKZ0GCR2HGhuCISqkVGCa8j44NIISamBYoUqmbBD1E6z1BwhrHjCBBsrZbjPQy0FvAXOKJQ5xILdHKOeG6XVulLaWG0H6ORv8ynarVZaHY7mDLXzt8KcQ4mQq4vy2_gEmiKyVA
link.rule.ids 310,311,783,787,792,793,799,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELYqGICl0BbxxgMjaeNH0nisaKMU2oJEkLpVsWNLCJFUtBng13NO2vIQA1tyQy5x4ruL_X3fIXRFuokixmOOSSEEcsGJI7l0HaKJFJQqaaQlCo8nfvTEb6fetIauN1wYrXUJPtNte1ju5ae5KuxSWYdbOTLL1tuGujrwK7bWZkXFZeDJJuc1wIOVPcpgSoNrTxDL7BCBxdQRSivtnc05X-9guqLT78WDStuQ2XQtfvRdKdNOWEfj9Q1XaJOXdrGUbfXxS8vxv0-0j1pfBD_8sEldB6imswaqrzs84NWEb6C9b3KFTRT1S7gHTrIU902Mc4MTbIEizuMcroR7UIA6g1KTArziwavUENbAvnjPlBXhzYsFDofhfQvF4SC-iZxVJwbnWbhLJ6FG-YYLoiT8D6Zp4rpgcJlUXS81gae4JhCsfC0FV5DzwaUWCaUayhUqk5Qdoq0sz_QRwpKnTLBASs1d3lWJgLfAGYVChxiw62PUtKM0m1daG7PVAJ38bb5EO1E8Hs1Gw8ndKdqt1l0tquYMbS3fCn0OBcNSXpTfySclT7Wf
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2007+Design%2C+Automation+%26+Test+in+Europe+Conference+%26+Exhibition&rft.atitle=Design+and+DfT+of+a+High-Speed+Area-Efficient+Embedded+Asynchronous+FIFO&rft.au=Wielage%2C+P.&rft.au=Marinissen%2C+E.J.&rft.au=Altheimer%2C+M.&rft.au=Wouters%2C+C.&rft.date=2007-04-01&rft.pub=IEEE&rft.isbn=9783981080124&rft.issn=1530-1591&rft.eissn=1558-1101&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FDATE.2007.364399&rft.externalDocID=4211909
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1530-1591&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1530-1591&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1530-1591&client=summon