Data learning techniques and methodology for Fmax prediction

• Published in: 2009 International Test Conference pp. 1 - 10
• Main Authors: Chen, J., Wang, L.-C., Po-Hsien Chang, Jing Zeng, Yu, S., Mateja, M.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.11.2009
• Subjects: Built-in self-test; Delay; Frequency conversion; Frequency measurement; Logic testing; Microprocessors; Predictive models; Semiconductor device measurement; Semiconductor device testing; System testing
• ISBN: 1424448689; 9781424448685
• ISSN: 1089-3539; 2378-2250
• DOI: 10.1109/TEST.2009.5355620

The question of whether or not structural test measurements can be used to predict functional or system Fmax, has been studied for many years. This paper presents a data learning approach to study the question. Given Fmax values and structural delay measurements on a set of sample chips, we propose a method called conformity check whose goal is to select a subset of conformal samples such that a more reliable predictor can be built on. Our predictor consists of two models, a conformal model that decides on a given chip if its Fmax is predictable or not, and a prediction model that outputs the predicted Fmax based on results obtained from structural test measurements. We explain the data learning methodology and study various data learning techniques using frequency data collected on a high-performance microprocessor design.