SLD constant-stress ADT data analysis based on time series method

Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered ade...

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Published in2009 8th International Conference on Reliability, Maintainability and Safety pp. 1313 - 1317
Main Authors Li Wang, Xiaoyang Li, Tongmin Jiang, Bo Wan
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2009
Subjects
Constant stress accelerated degradation testing (CSADT)
Data analysis
Degradation
Life estimation
Performance analysis
Predictive models
Stress
Super Luminescent Diode (SLD)
Superluminescent diodes
Testing
Time series analysis
Yttrium
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Abstract Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a time series modeling procedure to model product performance degradation data. An example of SLD CASDT is given as an application of the modeling technique and the estimation method is presented.
AbstractList Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a time series modeling procedure to model product performance degradation data. An example of SLD CASDT is given as an application of the modeling technique and the estimation method is presented.
Author Tongmin Jiang
Bo Wan
Li Wang
Xiaoyang Li
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  organization: Dept. of Syst. Eng., Beihang Univ., Beijing, China
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  surname: Tongmin Jiang
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  organization: Dept. of Syst. Eng., Beihang Univ., Beijing, China
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  surname: Bo Wan
  fullname: Bo Wan
  organization: Dept. of Syst. Eng., Beihang Univ., Beijing, China
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Snippet Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super...
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StartPage 1313
SubjectTerms Constant stress accelerated degradation testing (CSADT)
Data analysis
Degradation
Life estimation
Performance analysis
Predictive models
Stress
Super Luminescent Diode (SLD)
Superluminescent diodes
Testing
Time series analysis
Yttrium
Title SLD constant-stress ADT data analysis based on time series method
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